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IEA-PVPS T13-01 2014 Review of Failures of Photovoltaic Modules Final – Performance and Reliability of Photovoltaic Systems
This entry was posted in Crystalline, Renewables, Solar and tagged and back contact degradation, back sheet adhesion loss, burn marks, cell cracks, defective bypass diodes; and special failures of thin-film modules, delamination, disconnected cell and string interconnect ribbons, engineering lines, EVA discolouration, frame breakage, front glass breakage, image based methods, IV Curve, junction box failure, potential induced degradation, pv industry, PV module designers, PV Modules, shunt hot spots, snail tracks, Solar Curve, Solar PV, standardisation committees, such as micro arcs at glued connectors, technological research laboratories, test equipment developers, testing companies, UV fluorescence, visual inspection. Bookmark the permalink.
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