JinkoSolar, working with Soochow University, has secured the 2026 WITec Paper Award Gold for a study that exposes how tiny cracks and local stress in silicon wafers translate into real world power loss in solar cells. The paper, titled Correlative Raman Voltage Microscopy Revealing the Localized Structure Stress Relationship in Silicon Solar Cells, combines high resolution Raman microscopy with photovoltage and photocurrent scanning to create a detailed picture of where and why cells lose performance.
The research delivers sub-micron mapping of microcracks and stress, showing that areas under tensile stress close to microcracks are responsible for measurable drops in electrical output. It also highlights that local stress introduced during rear side manufacturing can trigger new cracks and speed up their growth, a finding with direct implications for production lines seeking to reduce field failures and warranty claims.
For module makers and cell producers, the technique provides a new quality control tool to prevent and manage microcracks during manufacturing, while also supporting the development and testing of ultra low degradation products designed for long term yield assurance.
Link to the full paper HERE
Author: Bryan Groeendaal
August 10, 2026
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